Quick x-ray microtomography using a laser-driven betatron source
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Quick x-ray microtomography using a laser-driven betatron source

A. Döpp,L. Hehn,J. Götzfried,J. Wenz,M. Gilljohann,H. Ding,S. Schindler,Franz Pfeiffer,S. Karsch;A. Döpp;L. Hehn;J. Götzfried;J. Wenz;M. Gilljohann;H. Ding;S. Schindler;Franz Pfeiffer;S. Karsch;
optica 2018 Vol. 5 pp. 199-203
223
karsch2018opticaquick

Keywords

image registration image quality phase contrast imaging laser systems tomographic image reconstruction x ray imaging

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DOI:
10.1364/optica.5.000199
URL:
https://sciprofiles.com/publication/view/29166d1b1...

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ID: 116034
Ref Key: karsch2018opticaquick
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10.1364/optica.5.000199
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