Data acquisition and processing for automated electron microscopy

O.L. Krivanek,W.J. De Ruijter,C.E. Meyer,M.L. Leber,J. Wilbrink;O.L. Krivanek;W.J. De Ruijter;C.E. Meyer;M.L. Leber;J. Wilbrink;

proceedings, annual meeting, electron microscopy society of america 1993 Vol. 51 pp. 546-547

194

wilbrink1993proceedings,data

computer microscope data acquisition optimized microprocessors handled automated electron microscopy protocol to communicate

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