In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures
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In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G.
ieee international conference on microelectronic test structures 2019 Vol. 2019-March pp. 12-17
213
gupta2019inieee

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DOI:
10.1109/ICMTS.2019.8730920

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