Microstructural characterisation of Bi2Se3 thin films
N V Tarakina;S Schreyeck;T Borzenko;S Grauer;C Schumacher;G Karczewski;C Gould;K Brunner;H Buhmann;L W Molenkamp;N V Tarakina;S Schreyeck;T Borzenko;S Grauer;C Schumacher;G Karczewski;C Gould;K Brunner;H Buhmann;L W Molenkamp;
journal of physics: conference series2013Vol. 471pp. 012043-