time domain characterization of light trapping states in thin film solar cells
Abstract
Spectral interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.
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150405
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150405
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10.1051/epjconf/20134108016
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