The technique of functional-logical simulation of System-on-Chip (SoC) total dose radiation failures is presented based on fuzzy logic sets theory. An analysis of the capabilities of this approach for IP-blocks radiation behavior is carried out along with the analysis of operating modes under irradiation influence on IP-blocks radiation behavior. The following elements of this technique application for simulation of dose radiation failures of various types of IP-units are studied: logical elements, memory units and cells, processors. Examples of criterial membership functions and operability functions construction are given for these IP-units and for various critical parameters characterizing their failures. It is shown that when modeling total dose failures it is necessary to take into account the influence of the functional mode on the model parameters. The technique proposed allows improving the reliability of the SoC radiation hardness estimation, also for the purpose of solving the problems of information security of electronic devices.