High Voltage Metrology with Collinear Laser Spectroscopy
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High Voltage Metrology with Collinear Laser Spectroscopy

Jorg Kramer,Kristian Konig,Christopher Geppert,Phillip Imgram,Bernhard Maab,Johann Meisner,Ernst Wilhelm Otten,Stephan Passon,Tim Ratajczyk,Johannes Ullmann,W. Nörtershäuser;Jorg Kramer;Kristian Konig;Christopher Geppert;Phillip Imgram;Bernhard Maab;Johann Meisner;Ernst Wilhelm Otten;Stephan Passon;Tim Ratajczyk;Johannes Ullmann;W. Nörtershäuser;
2018 conference on precision electromagnetic measurements (cpem 2018) 2018 pp. 1-2
252
nörtershäuser20182018high

Keywords

uncertainty ions voltage measurement laser excitation high-voltage techniques frequency measurement measurement by laser beam

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DOI:
10.1109/cpem.2018.8501251
URL:
https://sciprofiles.com/publication/view/9f24323c7...

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ID: 116531
Ref Key: nörtershäuser20182018high
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