Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon

W. Zhao,F. R. Brotzen,L. Hehn,P. J. Loos;W. Zhao;F. R. Brotzen;L. Hehn;P. J. Loos;

mrs proceedings 1998 Vol. 516 pp. 1-

231

loos1998mrsinterface

model intercalation thermal polycrystalline sio2 monocrystalline transverse earlier substantially

DOI:

URL:

ID: 115774

Ref Key: loos1998mrsinterface

Use this key to autocite in SciMatic or Thesis Manager

No Bibliography

Account:

NFT Contract Address:

0x95644003c57E6F55A65596E3D9Eac6813e3566dA

Article ID:

115774

Unique Identifier:

10.1557/proc-516-51

Network:

Scimatic Chain (ID: 481)

Authors

Abstract

Journal Name

Year

Title

4/5

Blockchain Upload Locked

Complete all 5 checklist items to tokenize your article

Gas fees required in SCI Coins

Coming soon

Reference Key: lastname+year+titlefirstword+journalfirstword

Article Type (Article, Book, Proceedings etc.)

Add a reference in a raw form. Our automatic system will correct it later.