Advances in Parallel-Detection EELS
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Advances in Parallel-Detection EELS

O.L. Krivanek,N. Dellby,A.J. Gubbens,M.K. Kundmann,M.L. Leber,D.A. Ray,K.V. Truong;O.L. Krivanek;N. Dellby;A.J. Gubbens;M.K. Kundmann;M.L. Leber;D.A. Ray;K.V. Truong;
proceedings, annual meeting, electron microscopy society of america 1990 Vol. 48 pp. 76-77
188
truong1990proceedings,advances

Keywords

resolution gun mdf minimum peels detectable routinely detection eels parallel

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DOI:
10.1017/s0424820100133977
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https://sciprofiles.com/publication/view/ecb0bf326...

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