Scanned conical illumination as a probe of electro-optic retro-reflection.

Scanned conical illumination as a probe of electro-optic retro-reflection.

Alshomrany, Ali S;Nguyen, Z;Maclennan, Joseph E;Clark, Noel A;
Optics express 2019 Vol. 27 pp. 18383-18398
214
alshomrany2019scannedoptics

Abstract

We describe a prototype element for use in probing electro-optic retro-reflection in sensor applications, illuminating a planar-aligned nematic liquid crystal electro-optic cell with convergent light having a single, tunable angle of incidence (tunable conical illumination). This illumination is generated using a 100X, high numerical aperture, long working-distance microscope objective under conditions of extreme spherical aberration. The electro-optic effect observed is multiple-beam optical interference between polarized reflections from the two bounding plates of the cell, rendered tunable with voltage-controlled refractive index changes induced by molecular reorientation of the liquid crystal. Characterization of the reflectivity vs. angle of incidence and applied voltage enables identification of conditions of high-contrast, low power, electro-optic reflectivity control applicable to fiber optics.

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