Cycle time prediction method for semiconductor wafer fabrication facility based on multi-layer data analysis framework

Cycle time prediction method for semiconductor wafer fabrication facility based on multi-layer data analysis framework

Tang, J.
jisuanji jicheng zhizao xitong/computer integrated manufacturing systems, cims 2019 Vol. 25 pp. 1086-1092
217
tang2019cyclejisuanji

Citation

ID: 66583
Ref Key: tang2019cyclejisuanji
Use this key to autocite in SciMatic or Thesis Manager

References

Blockchain Verification

Account:
NFT Contract Address:
0x95644003c57E6F55A65596E3D9Eac6813e3566dA
Article ID:
66583
Unique Identifier:
10.13196/j.cims.2019.05.006
Network:
Scimatic Chain (ID: 481)
Loading...
Blockchain Readiness Checklist
Authors
Abstract
Journal Name
Year
Title
4/5
Blockchain Upload Locked

Complete all 5 checklist items to tokenize your article

Saymatik Web3.0 Wallet