Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films

Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films

L. Kövér,S. Tougaard,J. Tóth,D. Varga,O. Dragoun,A. Kovalík,M. Ryšavý;L. Kövér;S. Tougaard;J. Tóth;D. Varga;O. Dragoun;A. Kovalík;M. Ryšavý;
Journal of Surface Analysis 2002 Vol. 9 pp. 281-284
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271976
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