Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films

Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films

L. Kövér;S. Tougaard;J. Tóth;D. Varga;O. Dragoun;A. Kovalík;M. Ryšavý;
Journal of Surface Analysis 2003 Vol. 9 pp. 281-284
153
kövér2003journaldetermination

Abstract

Inelastic mean free paths of electrons were determined from QUASES spectral shape analysis of high energy photoinduced K-Auger spectra of Cu, Ni and C …

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