Homogeneous, highly conductive, and transparent silver nanowire thin films were fabricated using a simple dip-coating technique and a subsequent annealing step. Silver nanowires with two different average lengths (11 μm and 19 μm) were used in the sample preparation to analyze the dependence of the sheet resistance on the length of the one-dimensional nanostructures. The best sample had a sheet resistance of 10.2 Ω/□ with optical transmittance of 89.9%. Two figures of merit, the electrical to optical conductivity ratio (σDC/σOP) and ϕTC, were obtained for all the samples in order to measure their performance as transparent conductive materials.