High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors
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High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors

Oshita, T.
ieee transactions on very large scale integration (vlsi) systems 2019 Vol. 27 pp. 821-829
210
oshita2019highvolumeieee

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DOI:
10.1109/TVLSI.2018.2882567

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ID: 22440
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