towards phasing using high x-ray intensity

towards phasing using high x-ray intensity

;Lorenzo Galli;Sang-Kil Son;Thomas R. M. Barends;Thomas A. White;Anton Barty;Sabine Botha;Sébastien Boutet;Carl Caleman;R. Bruce Doak;Max H. Nanao;Karol Nass;Robert L. Shoeman;Nicusor Timneanu;Robin Santra;Ilme Schlichting;Henry N. Chapman
european journal of orthopaedic surgery & traumatology : orthopedie traumatologie 2015 Vol. 2 pp. 627-634
132
galli2015iucrjtowards

Abstract

X-ray free-electron lasers (XFELs) show great promise for macromolecular structure determination from sub-micrometre-sized crystals, using the emerging method of serial femtosecond crystallography. The extreme brightness of the XFEL radiation can multiply ionize most, if not all, atoms in a protein, causing their scattering factors to change during the pulse, with a preferential `bleaching' of heavy atoms. This paper investigates the effects of electronic damage on experimental data collected from a Gd derivative of lysozyme microcrystals at different X-ray intensities, and the degree of ionization of Gd atoms is quantified from phased difference Fourier maps. A pattern sorting scheme is proposed to maximize the ionization contrast and the way in which the local electronic damage can be used for a new experimental phasing method is discussed.

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