Four methods for determining the composition of trace radioactive surface contamination of low-radioactivity metal
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Four methods for determining the composition of trace radioactive surface contamination of low-radioactivity metal

H.M. O'keeffe,T.H. Burritt,B.T. Cleveland,G. Doucas,N. Gagnon,N.A. Jelley,C. Kraus,I.T. Lawson,S. Majerus,S.R. McGee,A.W. Myers,A.W.P. Poon,Keith Rielage,R.G. Hamish Robertson,R.C. Rosten,L.C. Stonehill,B.A. VanDevender,T.D. Van Wechel;H.M. O'keeffe;T.H. Burritt;B.T. Cleveland;G. Doucas;N. Gagnon;N.A. Jelley;C. Kraus;I.T. Lawson;S. Majerus;S.R. McGee;A.W. Myers;A.W.P. Poon;Keith Rielage;R.G. Hamish Robertson;R.C. Rosten;L.C. Stonehill;B.A. VanDevender;T.D. Van Wechel;
nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 2011 Vol. 659 pp. 182-192
167
wechel2011nuclearfour

Keywords

low-background counting surface radioactivity

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DOI:
10.1016/j.nima.2011.08.060
URL:
https://sciprofiles.com/publication/view/8b0962c72...

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ID: 117136
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